Introduction to Transmission Electron Microscope (TEM) :

A transmission electron microscope (TEM) is an instrument that uses a beam of electrons to produce high-resolution images of a sample. It is an essential tool for many fields of science and technology, including materials science, biology, and chemistry.

Discovery of Transmission Electron Microscope (TEM):

• The TEM was first developed in the early 1930s by Max Knoll and Ernst Ruska.
• They were awarded the Nobel Prize in Physics in 1986 for their work in developing the TEM.

Principal of Transmission Electron Microscope (TEM):

• The TEM works by passing a beam of electrons through a thin sample.
• The electrons interact with the atoms of the sample and produce a variety of signals, including transmitted electrons and scattered electrons.
• These signals are then used to create an image of the sample.

Components:

• The main components of a TEM include the electron gun, the column, the specimen holder, and the detector.
• The electron gun produces the electron beam that is used to pass through the sample.
• The column is used to focus and control the electron beam.
• The specimen holder holds the thin sample in place during the scan.
• The detector is used to detect and measure the signals produced by the electron-sample interactions.

Steps:

• The first step in using a TEM is to prepare the sample. This can involve thinning the sample, cutting it into a thin slice, and then mounting it on a thin film.
• Next, the sample is placed on the specimen holder and the electron gun is turned on.
• The electron beam is then directed through the sample and the detector measures the signals produced by the electron-sample interactions.
• These signals are then used to create an image of the sample.

Applications:

• TEMs are used in a wide variety of fields, including materials science, biology, chemistry, and semiconductor manufacturing.
• They are used to study the structure and composition of materials, to examine biological samples, and to analyze chemical compounds.
• They are also used in semiconductor manufacturing to inspect and analyze the structure of semiconductor materials.

Conclusion:

The transmission electron microscope is an essential tool for many fields of science and technology. Its ability to produce high-resolution images of a sample has led to many important discoveries and advancements in a wide variety of fields. The TEM is particularly useful in studying samples that are too small to be visible with a light microscope, and because it uses a beam of electrons that can penetrate through the samples, it allows to observe the internal structure of the samples.